Australian X-ray Analytical Association
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 Awards 

 
Bob Cheary and Keith Norrish Awards

These two awards, one for XRF and one for diffraction, for “significant long term contributions” to analysis and will perpetuate the contribution of the person after whom the award is named. Each award will comprise an engraved medal. The award will be presented at the AXAA 2020 Conference and Exhibition (AXAA-2020).

The closing date for nominations for the Bob Cheary and Keith Norrish awards is 14th February 2020. 
Please click here for information regarding the selection criteria and application process. 

Recipients of the Bob Cheary AXAA Award for Excellence in Diffraction Analysis
2023 - Tony Raftery
2020 - Vanessa Peterson
2017 – Mark Raven

2014 – Rod Clapp
2011 – Brian O’Connor
2008 – Ian Madsen

Recipients of the Keith Norrish AXAA Award for Excellence in X-ray Fluorescence Analysis
2023 - Joel O'Dwyer
2020 - Sally Birch
2017 – Greg Moore

2014 – Bruce Chappell
2011 – Ken Turner
2008 – Damian Gore


Award for Excellence in Analysis by an Early Career Scientist:

This award serves to encourage the development of dynamic, young analysts in one of the various fields of analytical science of interest to the Australian X-ray Analytical Association (AXAA) membership. The award will celebrate “outstanding application of laboratory and/or major radiation facility analytical technique(s) so as to achieve significant impact in a field of endeavour". The recipient of the award will not be limited to having used any specific brand of instrument.
The award consists of $2000 to be used for professional development.

Recipients of the ANSTO Award for Excellence in Analysis by an Early Career Scientist
2023 - Frederick Marlton

Recipients of the Malvern Panalytical Award for Excellence in Analysis by an Early Career Scientist
2020 - Brianna Ganly
2017 - Mark Styles

​
AXAA Award for Excellence in Analysis by an Early Career Scientist:
This award serves to encourage the development of dynamic, young researchers in one of the various fields of analytical science of interest to the AXAA membership. The award will celebrate an “outstanding development in, or application of, analytical methodologies to understand minerals or materials, with an emphasis on industrially relevant processes and technologies". The recipient of the award will not be limited to having used any specific instrument.
​
Recipients of the AXAA Award for Excellence in Analysis by an Early Career Scientist
2014 – Joel O'Dwyer
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  • Home
  • About
  • Membership
  • Newsletters
  • Events
  • Awards
  • Resource Centre
    • X-Ray Facilities
    • AXAA-2017 Conference Public Lectures
    • Conference Proceedings >
      • AXAA-2017 Proceedings
      • AXAA-2014 Proceedings
    • Clay Analysis Part 1
    • Clay Analysis Part 2
    • Rietveld Analysis Part 1
    • Rietveld Analysis Part 2
    • Optimisation of Rietveld
    • Selecting the Correct X-ray
    • XRF Laboratory Tips Part 1
    • XRF Laboratory Tips Part 2
    • Trace Elements in Uranium Oxide
  • A Day in the Life
  • Links & Career Opportunities
  • Contact Us